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dc.contributor.authorYang, Po-Yuen_US
dc.contributor.authorWang, Jyh-Liangen_US
dc.contributor.authorChiu, Po-Chunen_US
dc.contributor.authorChou, Jung-Chuanen_US
dc.contributor.authorChen, Cheng-Weien_US
dc.contributor.authorLi, Hung-Hsienen_US
dc.contributor.authorCheng, Huang-Chungen_US
dc.date.accessioned2014-12-08T15:20:40Z-
dc.date.available2014-12-08T15:20:40Z-
dc.date.issued2011-11-01en_US
dc.identifier.issn0741-3106en_US
dc.identifier.urihttp://dx.doi.org/10.1109/LED.2011.2164230en_US
dc.identifier.urihttp://hdl.handle.net/11536/14696-
dc.description.abstractThe pH sensing properties of an extended-gate field-effect transistor (EGFET) with Al-doped ZnO (AZO) nanostructures are investigated. The AZO nanostructures with different Al dosages were synthesized on AZO/glass substrate via a simple hydrothermal growth method at 85 degrees C. The pH sensing characteristics of pH-EGFET sensors with an Al dosage of 1.98 at% can exhibit a higher voltage sensitivity of 57.95 mV/pH, a larger linearity of 0.9998, and a wide sensing range of pH 1-13, attributed to the well-aligned nanowire (NW) array, superior crystallinity, less structural defects, and better conductivity. Consequently, the hydrothermally grown AZO NWs demonstrate superior pH sensing characteristics and reveal the potentials for flexible and disposable biosensors.en_US
dc.language.isoen_USen_US
dc.subjectAl-doped zinc oxide (AZO)en_US
dc.subjectextended-gate field-effect transistor (EGFET)en_US
dc.subjecthydrothermal methoden_US
dc.subjectlow temperatureen_US
dc.titlepH Sensing Characteristics of Extended-Gate Field-Effect Transistor Based on Al-Doped ZnO Nanostructures Hydrothermally Synthesized at Low Temperaturesen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/LED.2011.2164230en_US
dc.identifier.journalIEEE ELECTRON DEVICE LETTERSen_US
dc.citation.volume32en_US
dc.citation.issue11en_US
dc.citation.spage1603en_US
dc.citation.epage1605en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000296239500045-
dc.citation.woscount5-
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