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dc.contributor.authorAhmad, Wael A.en_US
dc.contributor.authorLu, Jeng-Hauen_US
dc.contributor.authorKissinger, Dietmaren_US
dc.contributor.authorNg, Herman Jallien_US
dc.date.accessioned2018-08-21T05:57:04Z-
dc.date.available2018-08-21T05:57:04Z-
dc.date.issued2017-01-01en_US
dc.identifier.urihttp://hdl.handle.net/11536/147000-
dc.description.abstractThis paper examines the beam squinting phenomenon in millimeter-wave wideband series-fed on-board arrays with respect to the number of elements and bandwidth as an inherent scanning capability. 4-element and 6-element wideband 60 GHz differential patch arrays are designed, fabricated and measured. Both arrays cover more than 6 GHz of impedance bandwidth. The 6-element array undergoes 22 degrees beam squinting over 8 GHz with 13 dBi average gain, while the 4-element array undergoes 15 degrees squinting over 6 GHz with 11 dBi average gain.en_US
dc.language.isoen_USen_US
dc.subjectseries-feeden_US
dc.subjectmillimeter-waveen_US
dc.subjectdifferentialen_US
dc.subjectarrayen_US
dc.subjectscanningen_US
dc.subjectsquintingen_US
dc.titleBeam Squinting in Wideband 60 GHz On-Board Series-Fed Differential Patch Arraysen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2017 IEEE ASIA PACIFIC MICROWAVE CONFERENCE (APMC)en_US
dc.citation.spage13en_US
dc.citation.epage16en_US
dc.contributor.department電信工程研究所zh_TW
dc.contributor.departmentInstitute of Communications Engineeringen_US
dc.identifier.wosnumberWOS:000426648000004en_US
Appears in Collections:Conferences Paper


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