完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Ahmad, Wael A. | en_US |
dc.contributor.author | Lu, Jeng-Hau | en_US |
dc.contributor.author | Kissinger, Dietmar | en_US |
dc.contributor.author | Ng, Herman Jalli | en_US |
dc.date.accessioned | 2018-08-21T05:57:04Z | - |
dc.date.available | 2018-08-21T05:57:04Z | - |
dc.date.issued | 2017-01-01 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/147000 | - |
dc.description.abstract | This paper examines the beam squinting phenomenon in millimeter-wave wideband series-fed on-board arrays with respect to the number of elements and bandwidth as an inherent scanning capability. 4-element and 6-element wideband 60 GHz differential patch arrays are designed, fabricated and measured. Both arrays cover more than 6 GHz of impedance bandwidth. The 6-element array undergoes 22 degrees beam squinting over 8 GHz with 13 dBi average gain, while the 4-element array undergoes 15 degrees squinting over 6 GHz with 11 dBi average gain. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | series-feed | en_US |
dc.subject | millimeter-wave | en_US |
dc.subject | differential | en_US |
dc.subject | array | en_US |
dc.subject | scanning | en_US |
dc.subject | squinting | en_US |
dc.title | Beam Squinting in Wideband 60 GHz On-Board Series-Fed Differential Patch Arrays | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | 2017 IEEE ASIA PACIFIC MICROWAVE CONFERENCE (APMC) | en_US |
dc.citation.spage | 13 | en_US |
dc.citation.epage | 16 | en_US |
dc.contributor.department | 電信工程研究所 | zh_TW |
dc.contributor.department | Institute of Communications Engineering | en_US |
dc.identifier.wosnumber | WOS:000426648000004 | en_US |
顯示於類別: | 會議論文 |