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dc.contributor.authorSu, Hong-Yanen_US
dc.contributor.authorNishizawa, Shinichien_US
dc.contributor.authorWu, Yan-Shiunen_US
dc.contributor.authorShiomi, Junen_US
dc.contributor.authorLi, Yih-Langen_US
dc.contributor.authorOnodera, Hidetoshien_US
dc.date.accessioned2018-08-21T05:57:11Z-
dc.date.available2018-08-21T05:57:11Z-
dc.date.issued2017-01-01en_US
dc.identifier.urihttp://hdl.handle.net/11536/147157-
dc.description.abstractPin accessibility influences the routability of a design at the stage of block/chip assembling. The estimation model for pin accessibility in previous researches counts the total number of intersections between each pin and M2 routing tracks. It does not consider the variation of pin accessibility as the spacing between a pin and its neighboring pins and metal wires changes. Besides, it cannot properly deal with the off-grid pin access neither. In this paper, we propose a general model for pin accessibility estimation. In the model, all directions to connect to the boundary of a pin are under estimation. Off-grid pin access is also available. Experimental results show that the reduction rate of minimum area to complete the routing of a circuit can be 7.0% on average. Due to the diminishment of required area for routing, the total number of vias for higher metal layer also decrease under the same area constraint.en_US
dc.language.isoen_USen_US
dc.subjectCell layout designen_US
dc.subjectpin accessibilityen_US
dc.subjectroutabilityen_US
dc.subjectblock routingen_US
dc.titlePin Accessibility Evaluating Model for Improving Routability of VLSI Designsen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2017 30TH IEEE INTERNATIONAL SYSTEM-ON-CHIP CONFERENCE (SOCC)en_US
dc.citation.spage56en_US
dc.citation.epage61en_US
dc.contributor.department資訊工程學系zh_TW
dc.contributor.departmentDepartment of Computer Scienceen_US
dc.identifier.wosnumberWOS:000427618200011en_US
Appears in Collections:Conferences Paper