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dc.contributor.authorGritsenko, Vladimir A.en_US
dc.contributor.authorIslamov, Damir R.en_US
dc.contributor.authorPerevalov, Timofey V.en_US
dc.contributor.authorAliev, Vladimir Sh.en_US
dc.contributor.authorYelisseyev, Alexander P.en_US
dc.contributor.authorLomonova, Elena E.en_US
dc.contributor.authorPustovarov, Vladimir A.en_US
dc.contributor.authorChin, Alberten_US
dc.date.accessioned2019-04-02T06:00:13Z-
dc.date.available2019-04-02T06:00:13Z-
dc.date.issued2016-09-15en_US
dc.identifier.issn1932-7447en_US
dc.identifier.urihttp://dx.doi.org/10.1021/acs.jpcc.6b05457en_US
dc.identifier.urihttp://hdl.handle.net/11536/147837-
dc.description.abstractThe electronic properties of HfO2, in particular, luminescence and charge transport, are determined by defects and traps. The origin of luminescence centers and traps of charge carriers in a HfO2 crystal was studied using luminescence spectroscopy, charge transport, and quantum chemical calculation. The 2.7 eV luminescence band and 5.2 eV absorption/luminescence excitation band are associated with an oxygen vacancy. The thermal activation energy 1.25 eV, estimated from the charge transport and thermoluminescence experiment, is equal to half of the Stokes shift in photoluminescence spectra. Hence, oxygen vacancies are supposed to operate as electron traps in HfO2, and the charge transport is described by phonon-assisted tunneling between traps.en_US
dc.language.isoen_USen_US
dc.titleOxygen Vacancy in Hafnia as a Blue Luminescence Center and a Trap of Charge Carriersen_US
dc.typeArticleen_US
dc.identifier.doi10.1021/acs.jpcc.6b05457en_US
dc.identifier.journalJOURNAL OF PHYSICAL CHEMISTRY Cen_US
dc.citation.volume120en_US
dc.citation.spage19980en_US
dc.citation.epage19986en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.identifier.wosnumberWOS:000383641700009en_US
dc.citation.woscount18en_US
Appears in Collections:Articles