Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chen, Bo-Yuan | en_US |
dc.contributor.author | Chen, Kun-Ming | en_US |
dc.contributor.author | Chiu, Chia-Sung | en_US |
dc.contributor.author | Huang, Guo-Wei | en_US |
dc.contributor.author | Chen, Hsiu-Chih | en_US |
dc.contributor.author | Chen, Chun-Chi | en_US |
dc.contributor.author | Hsueh, Fu-Kuo | en_US |
dc.contributor.author | Chen, Min-Cheng | en_US |
dc.contributor.author | Chang, Edward Yi | en_US |
dc.date.accessioned | 2019-04-02T05:59:58Z | - |
dc.date.available | 2019-04-02T05:59:58Z | - |
dc.date.issued | 2017-04-01 | en_US |
dc.identifier.issn | 0021-4922 | en_US |
dc.identifier.uri | http://dx.doi.org/10.7567/JJAP.56.04CR09 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/147860 | - |
dc.description.abstract | Drain-extended FinFET transistors for RF power applications have been fabricated and is presented in this paper. Power FinFETs with a wide drain extension are proposed to reduce the drain resistance. Compared with conventional drain-extended FinFETs, our proposed new devices exhibit lower on-resistances and better high-frequency performances while keeping a similar breakdown voltage. The enhancements of the on-resistance and peak cutoff frequency are 16 and 56%, respectively, under an optimal drain-extension layout. These experimental results suggest that FinFET transistors with a wide drain extension could be used for RF power applications, increasing the possibility of integrating RF power parts into future FinFET system-on-a-chip technologies. (C) 2017 The Japan Society of Applied Physics | en_US |
dc.language.iso | en_US | en_US |
dc.title | RF power FinFET transistors with a wide drain-extended fin | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.7567/JJAP.56.04CR09 | en_US |
dc.identifier.journal | JAPANESE JOURNAL OF APPLIED PHYSICS | en_US |
dc.citation.volume | 56 | en_US |
dc.contributor.department | 材料科學與工程學系 | zh_TW |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Materials Science and Engineering | en_US |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000414623100087 | en_US |
dc.citation.woscount | 1 | en_US |
Appears in Collections: | Articles |