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dc.contributor.authorJeng, Wei-Deen_US
dc.contributor.authorHuang, Ting-Weien_US
dc.contributor.authorMang Ou-Yangen_US
dc.contributor.authorLee, Tsang-Hsingen_US
dc.contributor.authorHsieh, Yao-Fangen_US
dc.contributor.authorKuo, Yi-Tingen_US
dc.date.accessioned2014-12-08T15:20:48Z-
dc.date.available2014-12-08T15:20:48Z-
dc.date.issued2010en_US
dc.identifier.isbn978-0-8194-8294-5en_US
dc.identifier.issn0277-786Xen_US
dc.identifier.urihttp://hdl.handle.net/11536/14787-
dc.identifier.urihttp://dx.doi.org/10.1117/12.860389en_US
dc.description.abstractThe index for evaluating the ability of color reproduction is required. The color distribution index (CDI) was proposed to comment the display ability of color distribution of reproduction in CIE Lu'v' color space. A cell of Just Noticeable Difference (JND) for luminance and chromaticity (u'v') was proposed to qualify whether the reproduced colors are in some region of color volume of display. Human eye can perceive fewer colors at low luminance, however, the scalar of chromaticity (u'v') JND at low luminance was the same with the one at other luminance. CDI will be distorted at low luminance. In this paper, regarding perceptible vision at low luminance, we try to use chromaticity (a*b*) JND to replace chromaticity (u'v') JND. The color distribution will be discussed in CIE La*b* color space. We find that CDI at low luminance in CIE L*a*b* color space is higher than in CIE Lu'v' color space, as well as different gamma curves and different bit depths affect CDI. The displays are going to keep approaching 100% true color reproduction; hence the index for evaluating the ability of color reproduction is required.en_US
dc.language.isoen_USen_US
dc.subjectcoloren_US
dc.subjectcolor distribution indexen_US
dc.subjectgamma curveen_US
dc.subjectbit depthen_US
dc.titleResearch of Color Distribution Index in CIEL*a*b* Color Spaceen_US
dc.typeArticleen_US
dc.identifier.doi10.1117/12.860389en_US
dc.identifier.journalAPPLICATIONS OF DIGITAL IMAGE PROCESSING XXXIIIen_US
dc.citation.volume7798en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000287763500042-
Appears in Collections:Conferences Paper


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