完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Chen, Toly | en_US |
dc.date.accessioned | 2019-04-02T05:59:35Z | - |
dc.date.available | 2019-04-02T05:59:35Z | - |
dc.date.issued | 2018-08-01 | en_US |
dc.identifier.issn | 1868-5137 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1007/s12652-017-0504-6 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/147930 | - |
dc.description.abstract | Most methods for fitting an uncertain yield learning process involve using fuzzy logic and solving mathematical programming (MP) problems, and thus have several drawbacks. The present study proposed a novel fuzzy and artificial neural network (ANN) approach for overcoming these drawbacks. In the proposed methodology, an ANN is used instead of an MP model to facilitate generating feasible solutions. A two-stage procedure is established to train the ANN. The proposed methodology and several existing methods were applied to a real case in a semiconductor manufacturing factory, and the experimental results showed that the methodology outperformed the existing methods in the overall forecasting performance. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | Yield | en_US |
dc.subject | Learning | en_US |
dc.subject | Semiconductor | en_US |
dc.subject | Fuzzy | en_US |
dc.subject | Artificial neural network | en_US |
dc.title | An innovative fuzzy and artificial neural network approach for forecasting yield under an uncertain learning environment | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1007/s12652-017-0504-6 | en_US |
dc.identifier.journal | JOURNAL OF AMBIENT INTELLIGENCE AND HUMANIZED COMPUTING | en_US |
dc.citation.volume | 9 | en_US |
dc.citation.spage | 1013 | en_US |
dc.citation.epage | 1025 | en_US |
dc.contributor.department | 工業工程與管理學系 | zh_TW |
dc.contributor.department | Department of Industrial Engineering and Management | en_US |
dc.identifier.wosnumber | WOS:000440310900009 | en_US |
dc.citation.woscount | 0 | en_US |
顯示於類別: | 期刊論文 |