標題: Measuring Dynamic Operation Efficiency for Universal Top 10 TFT-LCDs by Improved Data Envelopment Analysis
作者: Lee, Z. Y.
Lin, Grace T. R.
Lee, S. J.
科技管理研究所
Institute of Management of Technology
關鍵字: Thin Film Transistor-Liquid Crystal Display (TFT-LCD);Improved Data Envelopment Analysis (DEA);Operation Efficiency;Window Analysis
公開日期: 1-八月-2018
摘要: Currently the major manufacturers of TFT-LCD (Thin Film Transistor-Liquid Crystal Display) in South Korea, Taiwan and Japan and contribute 80% sales in global market. In view of the rapid growth of global demand, TFT-LCD manufacturers face tremendous competition. In this context, how to configure the best resource allocation and create more profit tend to be the major issue. In this study, the TFT-LCD firms in China, Korea and Japan is analyzed. Based on the trend analysis by Industrial Technology Research Institute in Taiwan, public database and information, financial statements and annual reports of these firms, we use improved Data Envelopment Analysis (DEA) in association with Window Analysis to measure their dynamic operating performance in China, Korea and Japan.
URI: http://hdl.handle.net/11536/147999
ISSN: 0022-4456
期刊: JOURNAL OF SCIENTIFIC & INDUSTRIAL RESEARCH
Volume: 77
起始頁: 447
結束頁: 450
顯示於類別:期刊論文