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dc.contributor.authorZheng, Lilien_US
dc.contributor.authorGuo, Ziquanen_US
dc.contributor.authorYan, Weien_US
dc.contributor.authorLin, Yueen_US
dc.contributor.authorLu, Yijunen_US
dc.contributor.authorKuo, Hao-Chungen_US
dc.contributor.authorChen, Zhongen_US
dc.contributor.authorZhu, Lihongen_US
dc.contributor.authorWu, Tingzhuen_US
dc.contributor.authorGao, Yulinen_US
dc.date.accessioned2019-04-02T06:00:29Z-
dc.date.available2019-04-02T06:00:29Z-
dc.date.issued2018-01-01en_US
dc.identifier.issn2169-3536en_US
dc.identifier.urihttp://dx.doi.org/10.1109/ACCESS.2018.2869778en_US
dc.identifier.urihttp://hdl.handle.net/11536/148275-
dc.description.abstractA majority of luminance measurement systems are currently focused on measuring the total luminance of light-emitting diodes (LEDs). It has largely limit its application on micro-LEDs, which require capturing the microscopic surface luminance. In order to study the microscopic characteristics of micro-LED displays, in this paper we propose a practical method that can accurately measure the luminance of a whole micro-LED array and even the surface luminance distribution of any single micro-led chip on the array. The essentials of this method are a high-precision complementary metal oxide semiconductor camera and a self-made data processing algorithm. Results show that the maximum error of the luminance measurement is less than 8%, which can prove the accuracy of the method. The metrical wavelength range and the accuracy of system can be dynamically set according to the camera and microscope. Endowed with ultrahigh dynamic ranges, this system proves its competency for evaluating the spatially resolved distribution of luminance for high brightness micro-LEDs.en_US
dc.language.isoen_USen_US
dc.subjectMicro-LEDen_US
dc.subjectluminance measurementen_US
dc.subjectmicroscope with cameraen_US
dc.subjectinspection systemen_US
dc.subject3D luminance distributionen_US
dc.titleResearch on a Camera-Based Microscopic Imaging System to Inspect the Surface Luminance of the Micro-LED Arrayen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/ACCESS.2018.2869778en_US
dc.identifier.journalIEEE ACCESSen_US
dc.citation.volume6en_US
dc.citation.spage51329en_US
dc.citation.epage51336en_US
dc.contributor.department光電工程研究所zh_TW
dc.contributor.departmentInstitute of EO Enginerringen_US
dc.identifier.wosnumberWOS:000447030400001en_US
dc.citation.woscount1en_US
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