標題: | Surge protection design with surge-to-digital converter for microelectronic circuits and systems |
作者: | Chen, Wen-Chieh Ker, Ming-Dou 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
關鍵字: | Electrical overstress (EOS);Surge;Surge detection;Surge-to-digital converter;Surge protection |
公開日期: | 1-九月-2018 |
摘要: | A surge protection design with surge-to-digital converter is proposed to provide the surge protection for microelectronic products with more flexible applications. The proposed surge-to-digital converter can transfer the occurrences of the surge events into digital output codes by classifying the voltage levels of surge events. It can be used to avoid unwanted power-on reset action, redundant power consumption, or unexpected soft errors, achieving the stability improvement of microelectronic systems. With this surge-to-digital converter, a surge protection design against a surge test of 25 V can clamp the peak voltage of V-DD from 22.2 V to 5.6 V. The proposed converter has been verified in a 0.18-mu m CMOS process. |
URI: | http://dx.doi.org/10.1016/j.microrel.2018.06.087 http://hdl.handle.net/11536/148356 |
ISSN: | 0026-2714 |
DOI: | 10.1016/j.microrel.2018.06.087 |
期刊: | MICROELECTRONICS RELIABILITY |
Volume: | 88-90 |
起始頁: | 2 |
結束頁: | 5 |
顯示於類別: | 期刊論文 |