標題: Surge protection design with surge-to-digital converter for microelectronic circuits and systems
作者: Chen, Wen-Chieh
Ker, Ming-Dou
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
關鍵字: Electrical overstress (EOS);Surge;Surge detection;Surge-to-digital converter;Surge protection
公開日期: 1-九月-2018
摘要: A surge protection design with surge-to-digital converter is proposed to provide the surge protection for microelectronic products with more flexible applications. The proposed surge-to-digital converter can transfer the occurrences of the surge events into digital output codes by classifying the voltage levels of surge events. It can be used to avoid unwanted power-on reset action, redundant power consumption, or unexpected soft errors, achieving the stability improvement of microelectronic systems. With this surge-to-digital converter, a surge protection design against a surge test of 25 V can clamp the peak voltage of V-DD from 22.2 V to 5.6 V. The proposed converter has been verified in a 0.18-mu m CMOS process.
URI: http://dx.doi.org/10.1016/j.microrel.2018.06.087
http://hdl.handle.net/11536/148356
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2018.06.087
期刊: MICROELECTRONICS RELIABILITY
Volume: 88-90
起始頁: 2
結束頁: 5
顯示於類別:期刊論文