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dc.contributor.authorWang, Haoranen_US
dc.contributor.authorLin, Chih-Pingen_US
dc.date.accessioned2019-04-02T05:58:28Z-
dc.date.available2019-04-02T05:58:28Z-
dc.date.issued2018-12-01en_US
dc.identifier.issn0926-9851en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.jappgeo.2018.08.012en_US
dc.identifier.urihttp://hdl.handle.net/11536/148619-
dc.description.abstractResearches and applications of borehole electrical resistivity tomography (BHERT) were mostly about cross-hole ERT (CHERT). Literatures on single borehole-to-surface ERT are limited, although this type of measurement could be useful when only one borehole is available. The undesirable symmetric effect is an important issue in the borehole-to-surface ERT survey. It has been observed that not only the pure in-hole data but also some borehole-to-surface configurations would induce mirrored images in the inversion model. In this study, all the possible borehole-to-surface configurations were classified and investigated for their sensitivity patterns and imaging resolutions, and the root cause of the symmetric effect was revealed to be the condition where one current pole and one potential pole coexist in the borehole. The configurations without symmetric effect suffer from low resolution. The investigation finally led to seeking a balance between resolution enhancement and symmetric effect reduction. Two countermeasures to suppress the symmetrical mirroring were proposed. The combined data inversion approach is based on the capability of each array to resist symmetric effect, while the weighted model stacking technique (WMOST) is derived from the characteristics of inversion models. Both methods were shown to be effective in suppressing the symmetric effect while maintaining sufficient resolution. (C) 2018 Elsevier B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectBorehole-to-surface ERTen_US
dc.subjectSymmetric effecten_US
dc.subjectElectrode configurationsen_US
dc.titleCause and countermeasures for the symmetric effect in borehole-to-surface electrical resistivity tomographyen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.jappgeo.2018.08.012en_US
dc.identifier.journalJOURNAL OF APPLIED GEOPHYSICSen_US
dc.citation.volume159en_US
dc.citation.spage248en_US
dc.citation.epage259en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.identifier.wosnumberWOS:000453644600024en_US
dc.citation.woscount0en_US
Appears in Collections:Articles