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dc.contributor.authorChang, CPen_US
dc.contributor.authorLai, PLen_US
dc.contributor.authorTan, JJMen_US
dc.contributor.authorHsu, LHen_US
dc.date.accessioned2019-04-02T06:00:16Z-
dc.date.available2019-04-02T06:00:16Z-
dc.date.issued2004-12-01en_US
dc.identifier.issn0018-9340en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TC.2004.114en_US
dc.identifier.urihttp://hdl.handle.net/11536/148813-
dc.description.abstractDiagnosability is an important factor in measuring the reliability of an interconnection network, while the (node) connectivity is used to measure the fault tolerance of an interconnection network. We observe that there is a close relationship between the connectivity and the diagnosability. According to our results, a t-regular and t-connected network with at least 2t + 3 nodes is t-diagnosable. Furthermore, the diagnosability of the product networks is also investigated in this work. The product networks, including hypercube, mesh, and tori, comprise very important classes of interconnection networks. Herein, different combinations of t-diagnosable and t-connected are employed to study the diagnosability of the product networks.en_US
dc.language.isoen_USen_US
dc.subjectdiagnosabilityen_US
dc.subjectcomparison diagnosis modelen_US
dc.subjectt-diagnosableen_US
dc.subjectconnectivityen_US
dc.subjectorder graphen_US
dc.subjectproduct networksen_US
dc.titleDiagnosability of t-connected networks and product networks under the comparison diagnosis modelen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TC.2004.114en_US
dc.identifier.journalIEEE TRANSACTIONS ON COMPUTERSen_US
dc.citation.volume53en_US
dc.citation.spage1582en_US
dc.citation.epage1590en_US
dc.contributor.department資訊工程學系zh_TW
dc.contributor.departmentDepartment of Computer Scienceen_US
dc.identifier.wosnumberWOS:000224417200007en_US
dc.citation.woscount22en_US
Appears in Collections:Articles