標題: An Offset Readout Current Sensing Scheme for One-Resistor RRAM-Based Cross-Point Array
作者: Chen, You-Da
Chin, Albert
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
關鍵字: Nonvolatile;resistive random access memory (RRAM);cross-point array;sneak current;current sensing
公開日期: 1-二月-2019
摘要: The uneven sneak-path currents in resistive random access memory (RRAM) severely constrain the array size. To overcome this issue, we propose an innovative readout scheme that can fully offset the sneak-path currents in one-resistor (1R) RRAM array. Furthermore, the bit cell resistance (R-cell) in an RRAM array can be simply evaluated as the ratio of read voltage (V-read) to the sensed offset current (I-offset). Even under extreme device distribution, a 512x512 array size is still obtained. This is the largest array among simple 1R RRAM, without using a selector device or extra transistor.
URI: http://dx.doi.org/10.1109/LED.2018.2886552
http://hdl.handle.net/11536/148817
ISSN: 0741-3106
DOI: 10.1109/LED.2018.2886552
期刊: IEEE ELECTRON DEVICE LETTERS
Volume: 40
起始頁: 208
結束頁: 211
顯示於類別:期刊論文