Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Chen, You-Da | en_US |
| dc.contributor.author | Chin, Albert | en_US |
| dc.date.accessioned | 2019-04-02T06:00:27Z | - |
| dc.date.available | 2019-04-02T06:00:27Z | - |
| dc.date.issued | 2019-02-01 | en_US |
| dc.identifier.issn | 0741-3106 | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1109/LED.2018.2886552 | en_US |
| dc.identifier.uri | http://hdl.handle.net/11536/148817 | - |
| dc.description.abstract | The uneven sneak-path currents in resistive random access memory (RRAM) severely constrain the array size. To overcome this issue, we propose an innovative readout scheme that can fully offset the sneak-path currents in one-resistor (1R) RRAM array. Furthermore, the bit cell resistance (R-cell) in an RRAM array can be simply evaluated as the ratio of read voltage (V-read) to the sensed offset current (I-offset). Even under extreme device distribution, a 512x512 array size is still obtained. This is the largest array among simple 1R RRAM, without using a selector device or extra transistor. | en_US |
| dc.language.iso | en_US | en_US |
| dc.subject | Nonvolatile | en_US |
| dc.subject | resistive random access memory (RRAM) | en_US |
| dc.subject | cross-point array | en_US |
| dc.subject | sneak current | en_US |
| dc.subject | current sensing | en_US |
| dc.title | An Offset Readout Current Sensing Scheme for One-Resistor RRAM-Based Cross-Point Array | en_US |
| dc.type | Article | en_US |
| dc.identifier.doi | 10.1109/LED.2018.2886552 | en_US |
| dc.identifier.journal | IEEE ELECTRON DEVICE LETTERS | en_US |
| dc.citation.volume | 40 | en_US |
| dc.citation.spage | 208 | en_US |
| dc.citation.epage | 211 | en_US |
| dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
| dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
| dc.identifier.wosnumber | WOS:000457606300013 | en_US |
| dc.citation.woscount | 0 | en_US |
| Appears in Collections: | Articles | |

