標題: | Testing process performance based on capability index C-pk with critical values |
作者: | Pearn, WL Lin, PC 工業工程與管理學系 Department of Industrial Engineering and Management |
關鍵字: | process capability index;testing hypothesis;critical value |
公開日期: | 1-十二月-2004 |
摘要: | Process capability index C-pk has been widely used in the manufacturing industry as a process performance measure. In this paper, we investigate the natural estimator of the index C-pk, and show that under the assumption of normality its distribution can be expressed as a mixture of the chi-square and the normal distributions. We also implement the theory of hypothesis testing using the natural estimator of C-pk, and provide efficient Maple programs to calculate the p-values as well as the critical values for various values of alpha-risk, capability requirements, and sample sizes. The behavior of the p-values and critical values as functions of the distribution parameters are investigated to obtain tight critical values for reliable testing. Based on the test, we develop a simple and practical procedure for in-plant applications. The practitioners can use the proposed procedure to determine whether their process meets the preset capability requirement, and make reliable decisions. (C) 2004 Elsevier Ltd. All rights reserved. |
URI: | http://dx.doi.org/10.1016/j.cie.2003.03.001 http://hdl.handle.net/11536/148846 |
ISSN: | 0360-8352 |
DOI: | 10.1016/j.cie.2003.03.001 |
期刊: | COMPUTERS & INDUSTRIAL ENGINEERING |
Volume: | 47 |
起始頁: | 351 |
結束頁: | 369 |
顯示於類別: | 期刊論文 |