完整後設資料紀錄
DC 欄位 | 值 | 語言 |
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dc.contributor.author | Cheng, Hui-Wen | en_US |
dc.contributor.author | Lin, Shen-Chieh | en_US |
dc.contributor.author | Li, Zong-Lin | en_US |
dc.contributor.author | Sun, Kien-Wen | en_US |
dc.contributor.author | Lee, Chien-Ping | en_US |
dc.date.accessioned | 2019-04-02T05:58:19Z | - |
dc.date.available | 2019-04-02T05:58:19Z | - |
dc.date.issued | 2019-01-02 | en_US |
dc.identifier.issn | 1996-1944 | en_US |
dc.identifier.uri | http://dx.doi.org/10.3390/ma12020317 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/148922 | - |
dc.description.abstract | This paper discusses the issue of controlling the epitaxial growth of mixed group V alloys to form a type-I InGaAsSb/AlGaAsSb double quantum wells (QWs) structure. We also discuss the run-to-run reproducibility of lattice-matched AlGaAsSb alloys and strained In0.35Ga0.65As0.095Sb0.905 in terms of growth parameters (V/III ratio, Sb-2/As-2 ratio). Molecular beam epitaxy (MBE) was used to grow two type-I InGaAsSb double-QWs laser structures differing only in the composition of the bottom cladding layer: Al0.85Ga0.15As0.072Sb0.928 (sample A) and Al0.5Ga0.5As0.043Sb0.957 (sample B). Both samples were respectively used in the fabrication of photonic crystal surface-emitting lasers (PCSELs). Sample A presented surface lasing action from circular as well as triangular photonic crystals. Sample B did not present surface lasing due to the deterioration of the active region during the growth of the upper cladding. Our findings underline the importance of temperature in the epitaxial formation of AlxGa1-xAsySb1-y in terms of lasing performance. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | Type-I QW | en_US |
dc.subject | InGaAsSb | en_US |
dc.subject | AlGaAsSb | en_US |
dc.subject | MBE | en_US |
dc.subject | lattice matched | en_US |
dc.subject | PCSEL | en_US |
dc.title | PCSEL Performance of Type-I InGaAsSb Double-QWs Laser Structure Prepared by MBE | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.3390/ma12020317 | en_US |
dc.identifier.journal | MATERIALS | en_US |
dc.citation.volume | 12 | en_US |
dc.contributor.department | 應用化學系 | zh_TW |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | 奈米科技中心 | zh_TW |
dc.contributor.department | Department of Applied Chemistry | en_US |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.contributor.department | Center for Nanoscience and Technology | en_US |
dc.identifier.wosnumber | WOS:000459719000121 | en_US |
dc.citation.woscount | 0 | en_US |
顯示於類別: | 期刊論文 |