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dc.contributor.authorLin, Yu-Hsuanen_US
dc.contributor.authorWang, Chao-Hungen_US
dc.contributor.authorLee, Ming-Hsiuen_US
dc.contributor.authorLee, Dai-Yingen_US
dc.contributor.authorLin, Yu-Yuen_US
dc.contributor.authorLee, Feng-Minen_US
dc.contributor.authorLung, Hsiang-Lanen_US
dc.contributor.authorWang, Keh-Chungen_US
dc.contributor.authorTseng, Tseung-Yuenen_US
dc.contributor.authorLu, Chih-Yuanen_US
dc.date.accessioned2019-04-02T05:58:59Z-
dc.date.available2019-04-02T05:58:59Z-
dc.date.issued2019-03-01en_US
dc.identifier.issn0018-9383en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TED.2019.2894273en_US
dc.identifier.urihttp://hdl.handle.net/11536/149010-
dc.description.abstractResistive random access memory (ReRAM) is often considered as a strong candidate for storing the weights in non-von Neumann neuromorphic computing systems. This paper studies how nonideal memory characteristics, which include programing error, read fluctuation, and retention, affect the inference accuracy of the analog ReRAM neural networks by incorporating memory characteristics extracted from 1-Mb ReRAM into a simulated inference-only neural network. This paper also shows that the different layer in the network can tolerate different amount of such imperfects. We learned four key points: 1) the conductance range of memory with less relative fluctuation is preferred for designing the weight-conductance mapping; 2) the control of programing error is essential for high inference accuracy; 3) retention-induced conductance drift can be fatal to the neuromorphic system. A compensation scheme is proposed in this paper which can effectively recover the inference accuracy; and 4) for multilayer networks, avoiding weight errors in the front layers can help to maintain the inference accuracy by reducing calculation error which may otherwise accumulate and pass down the networks. The concepts and approaches of this paper can also be applied to evaluate other types of nonvolatile memories for artificial neural networks.en_US
dc.language.isoen_USen_US
dc.subjectAnalog memoryen_US
dc.subjectneuromorphic computingen_US
dc.subjectnoiseen_US
dc.subjectreliabilityen_US
dc.subjectresistive random access memory (ReRAM)en_US
dc.subjectstabilityen_US
dc.titlePerformance Impacts of Analog ReRAM Non-ideality on Neuromorphic Computingen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TED.2019.2894273en_US
dc.identifier.journalIEEE TRANSACTIONS ON ELECTRON DEVICESen_US
dc.citation.volume66en_US
dc.citation.spage1289en_US
dc.citation.epage1295en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000460970400023en_US
dc.citation.woscount0en_US
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