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dc.contributor.authorKumar, Dayananden_US
dc.contributor.authorAluguri, Rakeshen_US
dc.contributor.authorChand, Umeshen_US
dc.contributor.authorTseng, Tseung-Yuenen_US
dc.date.accessioned2019-04-02T05:58:58Z-
dc.date.available2019-04-02T05:58:58Z-
dc.date.issued2019-03-01en_US
dc.identifier.issn0018-9383en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TED.2019.2895416en_US
dc.identifier.urihttp://hdl.handle.net/11536/149011-
dc.description.abstractA bipolar, highly nonlinear n-p-n selector is coupled in series with resistive switching memory device to suppress the sneak path current. The memory characteristics are measured for the crossbar array fabricated on a flexible polyethylene terephthalate substrate. Dominant conduction mechanism is the Zener tunneling to obtain the high nonlinearity in the selector device. This phenomenon validates the I-V characteristics which are temperature dependent, which leads to decrease in the turn-on voltage of the device as the temperature increases. The proposed one bipolar selector-one resistor device demonstrates better memory characteristics with the high nonlinearity (similar to 10(3)), observable memory window of about one order, excellent ac endurance (10(7)) cycles, fast switching speed (60 ns), and stable retention (10(4) s) at 100 degrees C. The results show the substantial potential of the proposedone selector-one-resistor structure in suppressing the leakage current, making it attractive for future high-density flexible crossbar memory array.en_US
dc.language.isoen_USen_US
dc.subjectOne selector-one resistor (1S1R)en_US
dc.subjectresistive random accessmemory (RRAM)en_US
dc.subjectresistive switchingen_US
dc.subjectZener tunnelingen_US
dc.titleOne Bipolar Selector-One Resistor for Flexible Crossbar Memory Applicationsen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TED.2019.2895416en_US
dc.identifier.journalIEEE TRANSACTIONS ON ELECTRON DEVICESen_US
dc.citation.volume66en_US
dc.citation.spage1296en_US
dc.citation.epage1301en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000460970400024en_US
dc.citation.woscount0en_US
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