Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | FAN, JC | en_US |
dc.contributor.author | LEE, CP | en_US |
dc.contributor.author | HWANG, JA | en_US |
dc.contributor.author | HWANG, JH | en_US |
dc.date.accessioned | 2019-04-02T05:59:15Z | - |
dc.date.available | 2019-04-02T05:59:15Z | - |
dc.date.issued | 1995-09-01 | en_US |
dc.identifier.issn | 0741-3106 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1109/55.406799 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/149125 | - |
dc.description.abstract | Epitaxial lift-off (ELO) technique was used for the first time to transplant AlGaAs/GaAs Heterojunction Bipolar Transistors (HBT's) to Si substrates. Both preprocessed (devices processed before transplantation) and postprocessed (devices processed after transplantation) ELO HBT's On Si were demonstrated in this study. The characteristics of those HBT's on Si with either technique show nearly identical characteristics of the HBT's on GaAs without transplantation, indicating the film quality is maintained after transplantation. Devices with a high current gain of 550 were transplanted without any degradation, and the current gain is not limited by the ELO process. This current gain value is the highest reported for GaAs HBT's on Si with any techniques. | en_US |
dc.language.iso | en_US | en_US |
dc.title | ALGAAS/GAAS HETEROJUNCTION BIPOLAR-TRANSISTORS ON SI SUBSTRATE USING EPITAXIAL LIFT-OFF | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1109/55.406799 | en_US |
dc.identifier.journal | IEEE ELECTRON DEVICE LETTERS | en_US |
dc.citation.volume | 16 | en_US |
dc.citation.spage | 393 | en_US |
dc.citation.epage | 395 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:A1995RQ87100008 | en_US |
dc.citation.woscount | 10 | en_US |
Appears in Collections: | Articles |