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dc.contributor.authorChen, YFen_US
dc.contributor.authorKwei, CMen_US
dc.date.accessioned2019-04-02T05:58:32Z-
dc.date.available2019-04-02T05:58:32Z-
dc.date.issued1996-08-20en_US
dc.identifier.issn0039-6028en_US
dc.identifier.urihttp://dx.doi.org/10.1016/0039-6028(96)00616-4en_US
dc.identifier.urihttp://hdl.handle.net/11536/149278-
dc.description.abstractA new, general expression for the position-dependent differential inverse mean free path (DIMFP) of an electron penetrating into vacuum from a solid is derived. This DIMFP can be divided up into a bulk and a surface term. It is found that the surface effect is restricted to a surface layer extending on both sides of the vacuum-solid interface. An extended Drude dielectric function, which allows the characteristic oscillator strength, damping constant, and critical-point energy for each subband of valence electrons, is employed to estimate electron DIMFPs near Al and Au surfaces. Our results are relevant to the understanding of inelastic electron scattering near a solid surface.en_US
dc.language.isoen_USen_US
dc.subjectelectron-solid interactions, scatteringen_US
dc.subjectphotoelectron spectroscopyen_US
dc.titleElectron differential inverse mean free path for surface electron spectroscopyen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/0039-6028(96)00616-4en_US
dc.identifier.journalSURFACE SCIENCEen_US
dc.citation.volume364en_US
dc.citation.spage131en_US
dc.citation.epage140en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:A1996VC77700013en_US
dc.citation.woscount60en_US
Appears in Collections:Articles