完整後設資料紀錄
DC 欄位語言
dc.contributor.authorChuang, YHen_US
dc.contributor.authorWang, CJen_US
dc.contributor.authorHuang, JYen_US
dc.contributor.authorPan, CLen_US
dc.date.accessioned2019-04-02T06:00:55Z-
dc.date.available2019-04-02T06:00:55Z-
dc.date.issued1996-11-25en_US
dc.identifier.issn0003-6951en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.117290en_US
dc.identifier.urihttp://hdl.handle.net/11536/149362-
dc.description.abstractWe propose and demonstrate a novel nonoptical technique for regulation of tip-sample distance in a scanning near-field optical microscope (SNOM). The fiber tip for the SNOM is attached to one prong of a quartz tuning fork. The fork is dithered with a gated sinusoidal signal. The vibration of the freely oscillating fiber tip, which manifests as the induced piezoelectric voltage on the fork electrodes, is monitored during the half-period of the gated sinusoid for which the fork is not driven. The time-multiplexing scheme, thus, allows the tuning fork to serve as a dither and a sensor with high Q factor, simultaneously. The gating technique could also potentially allow the SNOM to be used for the investigation of surface relaxation dynamics with high spatial resolution and submillisecond time resolution. (C) 1996 American Institute of Physics.en_US
dc.language.isoen_USen_US
dc.titleNonoptical tip sample distance control for scanning near-field optical microscopyen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.117290en_US
dc.identifier.journalAPPLIED PHYSICS LETTERSen_US
dc.citation.volume69en_US
dc.citation.spage3312en_US
dc.citation.epage3314en_US
dc.contributor.department光電工程研究所zh_TW
dc.contributor.departmentInstitute of EO Enginerringen_US
dc.identifier.wosnumberWOS:A1996VU64700006en_US
dc.citation.woscount14en_US
顯示於類別:期刊論文