标题: An Effective Test for Supplier Selection Evaluation with Multiple Characteristics
作者: Tai, Y. T.
Pearn, W. L.
You, S. K.
工業工程與管理學系
Department of Industrial Engineering and Management
关键字: supplier selection evaluation;yield;multiple characteristics
公开日期: 1-十一月-2011
摘要: Recently, the extensive applications of thin-film transistor liquid crystal display (TFT-LCD) products have been increasing rapidly (for example, smart phones, monitors, and liquid crystal display televisions). Supplier selection in TFT-LCD manufacturing industries has become more essential and has received considerable attention. It is a problem of comparing two suppliers and selecting the one that has a significantly higher process capability. In this paper, we consider an effective test to determine supplier selection for glass substrate processes with multiple characteristics using the yield index S(pk)(T), which can provide an exact measure of the process yield. In order to determine the selection decisions, critical values of the hypothesis testing for two procedures are calculated. For the practitioners' convenience in applying our procedures, various sample sizes required for designated selection powers are tabulated and discussed. For illustration purposes, a real-world problem in TFT-LCD factories is considered and solved for supplier selection evaluation.
URI: http://hdl.handle.net/11536/14942
ISSN: 0090-3973
期刊: JOURNAL OF TESTING AND EVALUATION
Volume: 39
Issue: 6
起始页: 1165
结束页: 1173
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