標題: | Refractive-index measurement based on the effects of total internal reflection and the uses of heterodyne interferometry |
作者: | Chiu, MH Lee, JY Su, DC 光電工程研究所 Institute of EO Enginerring |
公開日期: | 1-May-1997 |
摘要: | A new method for measuring the refractive index is presented, First, the phase difference between s and p polarizations that is due to the total internal reflection is measured by heterodyne interferometry. Then, substituting this phase difference into the Fresnel equations, we can obtain the refractive index of the test medium. (C) 1997 Optical Society of America. |
URI: | http://dx.doi.org/10.1364/AO.36.002936 http://hdl.handle.net/11536/149510 |
ISSN: | 0003-6935 |
DOI: | 10.1364/AO.36.002936 |
期刊: | APPLIED OPTICS |
Volume: | 36 |
起始頁: | 2936 |
結束頁: | 2939 |
Appears in Collections: | Articles |