標題: Critical thickness and orbital ordering in ultrathin La0.7Sr0.3MnO3 films
作者: Huijben, M.
Martin, L. W.
Chu, Y. -H.
Holcomb, M. B.
Yu, P.
Rijnders, G.
Blank, D. H. A.
Ramesh, R.
材料科學與工程學系
Department of Materials Science and Engineering
公開日期: 1-九月-2008
摘要: Detailed analysis of transport, magnetism, and x-ray absorption spectroscopy measurements on ultrathin La0.7Sr0.3MnO3 films with thicknesses from 3 to 70 unit cells resulted in the identification of a lower critical thickness for a nonmetallic nonferromagnetic layer at the interface with the SrTiO3 (001) substrate of only three unit cells (similar to 12 angstrom). Furthermore, linear-dichroism measurements demonstrate the presence of a preferred (x(2)-y(2)) in-plane orbital ordering for all layer thicknesses without any orbital reconstruction at the interface. A crucial requirement for the accurate study of these ultrathin films is a controlled growth process, offering the coexistence of layer-by-layer growth and bulklike magnetic/transport properties.
URI: http://dx.doi.org/10.1103/PhysRevB.78.094413
http://hdl.handle.net/11536/149557
ISSN: 2469-9950
DOI: 10.1103/PhysRevB.78.094413
期刊: PHYSICAL REVIEW B
Volume: 78
Issue: 9
起始頁: 0
結束頁: 0
顯示於類別:期刊論文


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