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dc.contributor.authorLin, Gu-Rongen_US
dc.contributor.authorMoser, Stefan M.en_US
dc.date.accessioned2014-12-08T15:21:03Z-
dc.date.available2014-12-08T15:21:03Z-
dc.date.issued2011-08-01en_US
dc.identifier.issn0018-9448en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TIT.2011.2158470en_US
dc.identifier.urihttp://hdl.handle.net/11536/14960-
dc.description.abstractThe sum-rate capacity of a noncoherent memoryless multiple-access Rician fading channel is investigated under three different categories of power constraints: individual per user peak-power constraints, individual per user average-power constraints, or a global power-sharing average-power constraint. Upper and lower bounds on the sum-rate capacity are derived, and it is shown that at high signal-to-noise ratio the sum-rate capacity only grows double-logarithmically in the available power. The asymptotic behavior of capacity is then analyzed in detail and the exact asymptotic expansion is derived including its second term, the so-called fading number. It is shown that the fading number is identical to the fading number of the single-user Rician fading channel that is obtained when only the user seeing the best channel is transmitting and all other users are switched off at all times. This pessimistic result holds independently of the type of power constraint that is imposed.en_US
dc.language.isoen_USen_US
dc.subjectChannel capacityen_US
dc.subjectescaping to infinityen_US
dc.subjectfading numberen_US
dc.subjecthigh signal-to-noise ratio (SNR)en_US
dc.subjectmultiple-access channel (MAC)en_US
dc.subjectmultiple-input single-output (MISO)en_US
dc.subjectmultiple usersen_US
dc.subjectnoncoherent detectionen_US
dc.subjectRician fadingen_US
dc.subjectsum-rate capacityen_US
dc.titleThe Fading Number of a Multiple-Access Rician Fading Channelen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TIT.2011.2158470en_US
dc.identifier.journalIEEE TRANSACTIONS ON INFORMATION THEORYen_US
dc.citation.volume57en_US
dc.citation.issue8en_US
dc.citation.spage4983en_US
dc.citation.epage4991en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000295738500009-
dc.citation.woscount2-
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