Improved technique for measuring small angles

完整後設資料紀錄

DC 欄位	值	語言
dc.contributor.author	Chiu, MH	en_US
dc.contributor.author	Su, DC	en_US
dc.date.accessioned	2019-04-02T05:59:10Z	-
dc.date.available	2019-04-02T05:59:10Z	-
dc.date.issued	1997-10-01	en_US
dc.identifier.issn	0003-6935	en_US
dc.identifier.uri	http://dx.doi.org/10.1364/AO.36.007104	en_US
dc.identifier.uri	http://hdl.handle.net/11536/149647	-
dc.description.abstract	Based on the total-internal-reflection effect and heterodyne interferometry, an improved technique for measuring small angles is proposed. This technique not only expands the measurement range but it also improves measurement performances. Its validity is demonstrated. (C) 1997 Optical Society of America.	en_US
dc.language.iso	en_US	en_US
dc.subject	total-internal-reflection effect	en_US
dc.subject	heterodyne interferometry	en_US
dc.title	Improved technique for measuring small angles	en_US
dc.type	Article	en_US
dc.identifier.doi	10.1364/AO.36.007104	en_US
dc.identifier.journal	APPLIED OPTICS	en_US
dc.citation.volume	36	en_US
dc.citation.spage	7104	en_US
dc.citation.epage	7106	en_US
dc.contributor.department	光電工程研究所	zh_TW
dc.contributor.department	Institute of EO Enginerring	en_US
dc.identifier.wosnumber	WOS:A1997XX49600002	en_US
dc.citation.woscount	42	en_US
顯示於類別：	期刊論文