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dc.contributor.authorWu, K. H.en_US
dc.contributor.authorHsu, T. Y.en_US
dc.contributor.authorShih, H. C.en_US
dc.contributor.authorChen, Y. J.en_US
dc.contributor.authorLuo, C. W.en_US
dc.contributor.authorUen, T. M.en_US
dc.contributor.authorLin, J. -Y.en_US
dc.contributor.authorJuang, J. Y.en_US
dc.contributor.authorKobayashi, T.en_US
dc.date.accessioned2019-04-02T05:59:42Z-
dc.date.available2019-04-02T05:59:42Z-
dc.date.issued2009-02-15en_US
dc.identifier.issn0021-8979en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.3078082en_US
dc.identifier.urihttp://hdl.handle.net/11536/149752-
dc.description.abstractIn this work, we use ultrafast optical pump-optical probe spectroscopy to probe the polaron dynamics in La0.7Ca0.3MnO3 (LCMO) thin films. The temporal evolution in transient reflectivity change Delta R/R exhibits two relaxing components: a fast component with a time constant of subpicosecond and a slow component with time constant ranging from tens of picoseconds to hundreds of picoseconds. The amplitude of the fast component, though has been seldom discussed before, exhibits the similar temperature dependence with that of the resistivity and the neutron scattering intensity due to nanoscale correlated polarons. The results strongly suggest that the fast photoinduced reflectivity change may have been due to the photoexcitation and trapping process of correlated Jahn-Teller polarons in the paramagnetic and ferromagnetic phases and, thus, implies the presence of electronic inhomogeneity in LCMO manganites.en_US
dc.language.isoen_USen_US
dc.subjectcalcium compoundsen_US
dc.subjectferromagnetismen_US
dc.subjecthigh-speed optical techniquesen_US
dc.subjectJahn-Teller effecten_US
dc.subjectlanthanum compoundsen_US
dc.subjectneutron diffractionen_US
dc.subjectparamagnetismen_US
dc.subjectphotoexcitationen_US
dc.subjectphotoreflectanceen_US
dc.subjectpolaronsen_US
dc.subjectpulsed laser depositionen_US
dc.subjectthin filmsen_US
dc.titleUltrafast optical probes of polaron dynamics in La0.7Ca0.3MnO3 thin filmsen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.3078082en_US
dc.identifier.journalJOURNAL OF APPLIED PHYSICSen_US
dc.citation.volume105en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.department物理研究所zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.contributor.departmentInstitute of Physicsen_US
dc.identifier.wosnumberWOS:000263803300048en_US
dc.citation.woscount13en_US
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