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dc.contributor.authorCho, I. C.en_US
dc.contributor.authorNiu, H.en_US
dc.contributor.authorChen, C. H.en_US
dc.contributor.authorYu, Y. C.en_US
dc.contributor.authorHsu, C. H.en_US
dc.date.accessioned2014-12-08T15:21:04Z-
dc.date.available2014-12-08T15:21:04Z-
dc.date.issued2011-12-15en_US
dc.identifier.issn0168-583Xen_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.nimb.2011.04.099en_US
dc.identifier.urihttp://hdl.handle.net/11536/14978-
dc.description.abstractIt is well-known that the DNA damage caused by charged particles considerably differs from damage due to electromagnetic radiation. In the case of irradiation by charged particles the DNA lesions are more complex and clustered. Such clustered damage is presumed difficult to be repaired, and is potentially lethal. In this study, we utilize a 90 degrees-scattering system and related imaging techniques to investigate the accumulation of gamma-H2AX along the trajectory of charged particles. By immunostaining the gamma-H2AX protein, optical images of corresponding double strand breaks were observed using a high resolution confocal microscope. We demonstrate the difference in the accumulation of gamma-H2AX from irradiation by 1 MeV protons and that of 150 key X-rays. The acquired images were arranged and reconstructed into a 3D image using ImageJ software. We discovered that the gamma-H2AX foci, following irradiation by protons, have a tendency to extend in the beam direction, while those from X-ray irradiation tend to be smaller and more randomly distributed. These results can be explained by the physical model of energy deposition. Crown Copyright (C) 2011 Published by Elsevier B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectAcceleratoren_US
dc.subjectDNA damageen_US
dc.subjectBiological effect of radiationen_US
dc.titleDNA double-strand breaks induced along the trajectory of particlesen_US
dc.typeArticle; Proceedings Paperen_US
dc.identifier.doi10.1016/j.nimb.2011.04.099en_US
dc.identifier.journalNUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMSen_US
dc.citation.volume269en_US
dc.citation.issue24en_US
dc.citation.spage3129en_US
dc.citation.epage3136en_US
dc.contributor.department奈米科技中心zh_TW
dc.contributor.department友訊交大聯合研發中心zh_TW
dc.contributor.departmentCenter for Nanoscience and Technologyen_US
dc.contributor.departmentD Link NCTU Joint Res Ctren_US
dc.identifier.wosnumberWOS:000298363500062-
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