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dc.contributor.authorHan, WYen_US
dc.contributor.authorLin, JCen_US
dc.date.accessioned2019-04-02T05:59:14Z-
dc.date.available2019-04-02T05:59:14Z-
dc.date.issued1997-11-01en_US
dc.identifier.issn0097-8493en_US
dc.identifier.urihttp://dx.doi.org/10.1016/S0097-8493(97)00055-1en_US
dc.identifier.urihttp://hdl.handle.net/11536/149838-
dc.description.abstractIn this paper, a new approach to edge detection and image compression of bilevel error-diffused images is proposed. The proposed approach is directly applied to the error-diffused images without any inverse halftoning technique. The main idea behind the proposed edge detection method is to compute the consistency value of each pixel of the error-diffused image, and the computed values are then clustered into two classes to obtain the desired edges. Here, the consistency value is a function of the mass center and geometric center of the window; more precisely, it represents the possibility that the area covered by the window can be uniform. As for compression, each error-diffused input image is compressed by dividing the image into non-overlapping blocks with size 8x8, then each highly-consistent block is encoded by its average illumination, and each lowly-consistent block is transmitted directly using the original bitmap. The threshold to distinguish these two kinds of blocks is automatically calculated based on the compression rate required by the users. The complexity of our compression technique is low, and this fast method can be used in real-time application. (C) 1997 Elsevier Science Ltd. All rights reserved.en_US
dc.language.isoen_USen_US
dc.titleEdge detection and edge-preserved compression for error-diffused imagesen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/S0097-8493(97)00055-1en_US
dc.identifier.journalCOMPUTERS & GRAPHICSen_US
dc.citation.volume21en_US
dc.citation.spage757en_US
dc.citation.epage767en_US
dc.contributor.department資訊工程學系zh_TW
dc.contributor.departmentDepartment of Computer Scienceen_US
dc.identifier.wosnumberWOS:000071886400008en_US
dc.citation.woscount2en_US
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