Title: An Improved Approach for Estimating Product Performance Based on the Capability Index C-pmk
Authors: Pearn, W. L.
Yang, Dong-Yuh
Cheng, Ya-Ching
工業工程與管理學系
Department of Industrial Engineering and Management
Keywords: Confidence level;Coverage rate;Generalized confidence intervals;Lower confidence bound;Process capability index;Process loss;Process yield
Issue Date: 1-Jan-2009
Abstract: In this article, we construct an improved procedure for estimating the process capability index C-pmk. We propose a new Cpmk lower-bound approach based on the GCI concept, and compare it with other existing methods. Based on the comparison results, we conclude with a recommendation, and construct a step-by-step procedure for the recommended approach to estimate the actual process capability Cpmk for various sample sizes. The lower bound attended by our recommended approach, indeed, improves other existing lower bound methods. We also investigate a real-world application to illustrate how we could apply the recommended approach to the actual manufacturing processes.
URI: http://dx.doi.org/10.1080/03610910903249494
http://hdl.handle.net/11536/149843
ISSN: 0361-0918
DOI: 10.1080/03610910903249494
Journal: COMMUNICATIONS IN STATISTICS-SIMULATION AND COMPUTATION
Volume: 38
Begin Page: 2073
End Page: 2095
Appears in Collections:Articles