Process Selection for Higher Production Yield Based on Capability Index S-pk

Abstract

Process selection is the problem of comparing two processes and selecting the one that has a higher capability value. In this paper, we consider the process selection problem by using the yield index S-pk to compare two production processes and select one that has higher production yield. An analytical exact approach is proposed to solve this problem. Testing hypotheses with two phases for comparing two processes are developed. Critical values of the test are obtained to determine the selection decisions. Sample sizes required for designated selection power and confidence level are also investigated. The results provide useful information to practitioners. An application example on comparing two thin-film transistor (TFT) type liquid-crystal display (LCD) production processes is presented to illustrate the practicality of the proposed approach to a real problem in the factory. Copyright (C) 2009 John Wiley & Sons, Ltd.