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dc.contributor.authorTsang, JSen_US
dc.contributor.authorLee, CPen_US
dc.contributor.authorLee, SHen_US
dc.contributor.authorTsai, KLen_US
dc.contributor.authorTsai, CMen_US
dc.contributor.authorFan, JCen_US
dc.date.accessioned2014-12-08T15:02:54Z-
dc.date.available2014-12-08T15:02:54Z-
dc.date.issued1996-01-15en_US
dc.identifier.issn0021-8979en_US
dc.identifier.urihttp://hdl.handle.net/11536/1499-
dc.description.abstractCompositional disordering of InGaAs/GaAs superlattices using a low-temperature-grown GaAs cap layer (LT-GaAs) by molecular beam epitaxy has been studied. The disordering of the superlattice was verified by photoluminescence and double-crystal x-ray rocking curve measurements. The Ga-vacancy-enhanced interdiffusion due to the presence of LT-GaAs was found to be the disordering mechanism. Diffusion equations and the Schrodinger's equation were solved numerically to obtain the composition profile and the transition energies in the disordered quantum well, respectively. The simulated energy shifts for samples under different annealing conditions agreed very well with the experimental results. The calculated effective diffusivity for the In-Ga interdiffusion has an activation energy of 1.63 eV, which is smaller than the activation energy 1.93 eV, for intrinsic interdiffusion. The diffusivity for the enhanced In-Ga interdiffusion due to the presence of LT-GaAs is about two orders of magnitude larger than the intrinsic In-Ga diffusivity. (C) 1996 American Institute of Physics.en_US
dc.language.isoen_USen_US
dc.titleCompositional disordering of InGaAs/GaAs heterostructures by low-temperature-grown GaAs layersen_US
dc.typeArticleen_US
dc.identifier.journalJOURNAL OF APPLIED PHYSICSen_US
dc.citation.volume79en_US
dc.citation.issue2en_US
dc.citation.spage664en_US
dc.citation.epage670en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:A1996TQ77500016-
dc.citation.woscount35-
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