完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Damodaran, Anoop R. | en_US |
dc.contributor.author | Liang, Chen-Wei | en_US |
dc.contributor.author | He, Qing | en_US |
dc.contributor.author | Peng, Chun-Yen | en_US |
dc.contributor.author | Chang, Li | en_US |
dc.contributor.author | Chu, Ying-Hao | en_US |
dc.contributor.author | Martin, Lane W. | en_US |
dc.date.accessioned | 2019-04-02T05:58:57Z | - |
dc.date.available | 2019-04-02T05:58:57Z | - |
dc.date.issued | 2011-07-26 | en_US |
dc.identifier.issn | 0935-9648 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1002/adma.201101164 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/150353 | - |
dc.description.abstract | The presence of a variety of structural variants in BiFeO3 thin films give rise to exotic electric-field-induced responses and resulting electromechanical responses as large as 5%. Using high-resolution X-ray diffraction and scanning-probe-microscopy-based studies the numerous phases present at the phase boundaries are identified and an intermediate monoclinic phase, in addition to the previously observed rhombohedral- and tetragonal-like phases, is discovered. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Nanoscale Structure and Mechanism for Enhanced Electromechanical Response of Highly Strained BiFeO3 Thin Films | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1002/adma.201101164 | en_US |
dc.identifier.journal | ADVANCED MATERIALS | en_US |
dc.citation.volume | 23 | en_US |
dc.citation.spage | 3170 | en_US |
dc.contributor.department | 材料科學與工程學系 | zh_TW |
dc.contributor.department | Department of Materials Science and Engineering | en_US |
dc.identifier.wosnumber | WOS:000294091700010 | en_US |
dc.citation.woscount | 105 | en_US |
顯示於類別: | 期刊論文 |