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dc.contributor.authorDamodaran, Anoop R.en_US
dc.contributor.authorLiang, Chen-Weien_US
dc.contributor.authorHe, Qingen_US
dc.contributor.authorPeng, Chun-Yenen_US
dc.contributor.authorChang, Lien_US
dc.contributor.authorChu, Ying-Haoen_US
dc.contributor.authorMartin, Lane W.en_US
dc.date.accessioned2019-04-02T05:58:57Z-
dc.date.available2019-04-02T05:58:57Z-
dc.date.issued2011-07-26en_US
dc.identifier.issn0935-9648en_US
dc.identifier.urihttp://dx.doi.org/10.1002/adma.201101164en_US
dc.identifier.urihttp://hdl.handle.net/11536/150353-
dc.description.abstractThe presence of a variety of structural variants in BiFeO3 thin films give rise to exotic electric-field-induced responses and resulting electromechanical responses as large as 5%. Using high-resolution X-ray diffraction and scanning-probe-microscopy-based studies the numerous phases present at the phase boundaries are identified and an intermediate monoclinic phase, in addition to the previously observed rhombohedral- and tetragonal-like phases, is discovered.en_US
dc.language.isoen_USen_US
dc.titleNanoscale Structure and Mechanism for Enhanced Electromechanical Response of Highly Strained BiFeO3 Thin Filmsen_US
dc.typeArticleen_US
dc.identifier.doi10.1002/adma.201101164en_US
dc.identifier.journalADVANCED MATERIALSen_US
dc.citation.volume23en_US
dc.citation.spage3170en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.identifier.wosnumberWOS:000294091700010en_US
dc.citation.woscount105en_US
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