Title: | Effects of rapid thermal annealing on the structural properties of TiO2 nanotubes |
Authors: | Lin, J. Y. Chou, Y. T. Shen, J. L. Yang, M. D. Wu, C. H. Chi, G. C. Chou, W. C. Ko, C. H. 電子物理學系 光電工程學系 Department of Electrophysics Department of Photonics |
Keywords: | TiO2;Nanotubes;Raman scattering;Rapid thermal annealing |
Issue Date: | 15-Oct-2011 |
Abstract: | The structural properties of TiO2 nanotubes with rapid thermal annealing (RTA) and traditional thermal annealing in O-2 were studied by X-ray diffraction (XRD) and Raman scattering measurements. From analyzing the line width of XRD and the correlation length of the Raman peak, we demonstrate that RTA can be an effective tool for amorphous-anatase transformation in TiO2 nanotubes. The Raman peak redshifts and reduces its line width after thermal annealing and RTA, which may involves the reduction of oxygen-related defects. (C) 2011 Elsevier B. V. All rights reserved. |
URI: | http://dx.doi.org/10.1016/j.apsusc.2011.08.073 http://hdl.handle.net/11536/150403 |
ISSN: | 0169-4332 |
DOI: | 10.1016/j.apsusc.2011.08.073 |
Journal: | APPLIED SURFACE SCIENCE |
Volume: | 258 |
Begin Page: | 530 |
End Page: | 534 |
Appears in Collections: | Articles |