完整後設資料紀錄
DC 欄位語言
dc.contributor.authorPearn, W. L.en_US
dc.contributor.authorShiau, J. -J. H.en_US
dc.contributor.authorTai, Y. T.en_US
dc.contributor.authorLi, M. Y.en_US
dc.date.accessioned2019-04-02T05:57:59Z-
dc.date.available2019-04-02T05:57:59Z-
dc.date.issued2011-12-01en_US
dc.identifier.issn0748-8017en_US
dc.identifier.urihttp://dx.doi.org/10.1002/qre.1200en_US
dc.identifier.urihttp://hdl.handle.net/11536/150420-
dc.description.abstractProcess capability index C-pk is the most popular capability index widely used in the manufacturing industry. Existing research on the yield-based measure index C-pk to date is restricted to processes with single characteristics. However, many manufacturing processes are commonly described with multiple characteristics, for example, the gold bumping process in the TFT-LCD (thin film transistor-liquid crystal display) manufacturing industry. In the gold bumping process, gold bumps have multiple characteristics all having effects on the process yield. Obtaining accurate gold bumping manufacturing yield is very important for quality assurance and in providing guidance toward process improvement. To obtain accurate yield assessment for processes with multiple characteristics, we propose a new overall yield-measure index C-pk(T), which is a generalization of the index C-pk, and a natural estimator (C) over cap (T)(pk) of C-pk(T). For the purpose of making inferences on the process capability, we derive a quite accurate approximation of the distribution of (C) over cap (T)(pk) since the distribution is analytically intractable. With this distribution, we tabulate the lower confidence bounds of the new index under various sample sizes for in-plant applications. In addition, we construct a statistical test on the new yield-measure index in order to examine whether the yield meets the customers' requirements. For illustration purpose, a real case in a gold bumping factory located in the Science-based Industrial Park at Hsinchu, Taiwan is presented. Copyright (C) 2011 John Wiley & Sons, Ltd.en_US
dc.language.isoen_USen_US
dc.subjectcapability assessmenten_US
dc.subjectyielden_US
dc.subjectmultiple characteristicsen_US
dc.subjectlower confidence bounden_US
dc.titleCapability Assessment for Processes with Multiple Characteristics: A Generalization of the Popular Index C-pken_US
dc.typeArticleen_US
dc.identifier.doi10.1002/qre.1200en_US
dc.identifier.journalQUALITY AND RELIABILITY ENGINEERING INTERNATIONALen_US
dc.citation.volume27en_US
dc.citation.spage1119en_US
dc.citation.epage1129en_US
dc.contributor.department統計學研究所zh_TW
dc.contributor.department工業工程與管理學系zh_TW
dc.contributor.departmentInstitute of Statisticsen_US
dc.contributor.departmentDepartment of Industrial Engineering and Managementen_US
dc.identifier.wosnumberWOS:000297931600013en_US
dc.citation.woscount25en_US
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