標題: Field Emission Properties and Reliability of ZnO Nanorod, Nanopagoda, and Nanotip Current Emitters
作者: Yao, I. -Chuan
Lin, Pang
Tseng, Tseung-Yuen
材料科學與工程學系
電子工程學系及電子研究所
Department of Materials Science and Engineering
Department of Electronics Engineering and Institute of Electronics
關鍵字: Field emission properties;ZnO nanorod;nanopagoda;nanotip;oxygen plasma treatment;reliability
公開日期: 1-七月-2012
摘要: Fabrication, optical, and field emission properties of ZnO nanorod, nanopagoda, and nanotip emitters were studied. The ZnO nanotip emitters are prepared by using combination of solution method and oxygen plasma treatment. All the emitters exhibit a highly c-axis preferred orientation crystalline structure. The nanopagoda and nanotip emitters have turn-on fields of 1.43 and 1.07 V/mu m, respectively, under 1 mu A/cm(2) and field enhancement factors of 3681 and 4735 at 25 degrees C, respectively. The nanotip emitters with tip angle of 20 degrees and number density of 10 emitters/mu m(2) have very stable emission at 25 degrees C over 2 x 10(4) s and successive operation between the 25 degrees C and 100 degrees C over 5000 s. Our finding provides an effective route for practical applications in flat panel display and light-emitting device in the future.
URI: http://dx.doi.org/10.1109/TNANO.2012.2195502
http://hdl.handle.net/11536/150461
ISSN: 1536-125X
DOI: 10.1109/TNANO.2012.2195502
期刊: IEEE TRANSACTIONS ON NANOTECHNOLOGY
Volume: 11
起始頁: 746
結束頁: 750
顯示於類別:期刊論文