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dc.contributor.authorWu, K. H.en_US
dc.contributor.authorGou, I. C.en_US
dc.contributor.authorLuo, C. W.en_US
dc.contributor.authorUen, T. M.en_US
dc.contributor.authorLin, J-Yen_US
dc.contributor.authorJuang, J. Y.en_US
dc.contributor.authorKobayashi, T.en_US
dc.contributor.authorChen, C. K.en_US
dc.contributor.authorLee, J. M.en_US
dc.contributor.authorChen, J. M.en_US
dc.date.accessioned2019-04-03T06:47:40Z-
dc.date.available2019-04-03T06:47:40Z-
dc.date.issued2010-01-01en_US
dc.identifier.issn1742-6588en_US
dc.identifier.urihttp://dx.doi.org/10.1088/1742-6596/200/1/012227en_US
dc.identifier.urihttp://hdl.handle.net/11536/150528-
dc.description.abstractPure phase TbMnO3 manganite thin films with hexagonal (h-TMO) and orthorhombic (o- TMO) crystal structures were prepared by pulsed laser deposition. The distinctive orientation alignments between film and substrate obtained here have allowed us to perform the x-ray absorption near edge spectroscopy (XANES) measurements with the electric field applied along the three major crystallographic directions. The XANES results, as expected, display significantly different spectral features for the h-TMO and o-TMO films. In addition, the XANES spectra also exhibit strong polarization dependence at O K and Mn L edges for both samples.en_US
dc.language.isoen_USen_US
dc.titlePolarization-dependent x-ray absorption spectroscopy of hexagonal and orthorhombic TbMnO3 thin filmsen_US
dc.typeProceedings Paperen_US
dc.identifier.doi10.1088/1742-6596/200/1/012227en_US
dc.identifier.journalINTERNATIONAL CONFERENCE ON MAGNETISM (ICM 2009)en_US
dc.citation.volume200en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000291321301043en_US
dc.citation.woscount4en_US
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