Full metadata record
DC Field | Value | Language |
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dc.contributor.author | Hsieh, Meng-Chien | en_US |
dc.contributor.author | Wang, Jia-Feng | en_US |
dc.contributor.author | Wang, Yu-Shou | en_US |
dc.contributor.author | Yang, Cheng-Hong | en_US |
dc.contributor.author | Chen, Ross C. C. | en_US |
dc.contributor.author | Chiang, Chen-Hao | en_US |
dc.contributor.author | Chen, Yung-Fu | en_US |
dc.contributor.author | Chen, Jenn-Fang | en_US |
dc.date.accessioned | 2014-12-08T15:21:13Z | - |
dc.date.available | 2014-12-08T15:21:13Z | - |
dc.date.issued | 2011-11-15 | en_US |
dc.identifier.issn | 0021-8979 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1063/1.3663436 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/15060 | - |
dc.description.abstract | This study elucidates the influence of the N-related localized states on electron emission properties of a GaAsN quantum well (QW) that is grown by molecular beam epitaxy. The N-related localized states in a GaAsN QW are identified as both optical and electrical electron trap states. Furthermore, exactly how N-related localized states influence the electron emission properties of a GaAsN quantum well is examined. The presence of N-related localized states effectively suppresses the tunneling emission of GaAsN QW electron states, leading to a long electron emission time for the GaAsN QW electron states. Thermal annealing can reduce the number of N-related localized states, resulting in a recovery of the tunneling emission for GaAsN QW electron states. Increasing the annealing temperature can restore the electron emission behavior of GaAsN QW to the typical electron tunneling emission for a high-quality QW. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3663436] | en_US |
dc.language.iso | en_US | en_US |
dc.title | Role of the N-related localized states in the electron emission properties of a GaAsN quantum well | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1063/1.3663436 | en_US |
dc.identifier.journal | JOURNAL OF APPLIED PHYSICS | en_US |
dc.citation.volume | 110 | en_US |
dc.citation.issue | 10 | en_US |
dc.citation.epage | en_US | |
dc.contributor.department | 電子物理學系 | zh_TW |
dc.contributor.department | Department of Electrophysics | en_US |
dc.identifier.wosnumber | WOS:000297943700067 | - |
dc.citation.woscount | 1 | - |
Appears in Collections: | Articles |
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