完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Chang, Kow-Ming | en_US |
dc.contributor.author | Chen, Chu-Feng | en_US |
dc.contributor.author | Lai, Chiung-Hui | en_US |
dc.contributor.author | Wu, Chin-Ning | en_US |
dc.contributor.author | Hsieh, Cheng-Ting | en_US |
dc.contributor.author | Wang, Yu-Bin | en_US |
dc.contributor.author | Liu, Chung-Hsien | en_US |
dc.contributor.author | Chang, Kuo-Chin | en_US |
dc.date.accessioned | 2019-04-02T06:04:17Z | - |
dc.date.available | 2019-04-02T06:04:17Z | - |
dc.date.issued | 2013-01-01 | en_US |
dc.identifier.issn | 1938-5862 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1149/04514.0055ecst | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/150619 | - |
dc.description.abstract | The Ge condensation method is effective in increasing the Ge fraction of Ge in SGOI. Previous studies by the authors confirmed a correlation between the Ge fraction and the sensitivity of the SiGe nano-wire sensor. To understand how Ge condensation on an SGOI nano-wire sensor helps to optimize oxidation conditions and sensitivity, the effect of oxidizing gas and the SiGe/alpha-Si stacked structure on the movement of Ge is investigated. The analytical results reveal that the sensitivity of SiGe nano-wires can be optimized by stacking an Si1-xGex layer that contains 14% Ge on a 200 angstrom-thick alpha-Si layer and treating the stack with O-2 gas diluted by 13% N-2 for 3 min. | en_US |
dc.language.iso | en_US | en_US |
dc.title | OXIDATION STUDY OF GE CONDENSATION ON SGOI NANOWIRE BIOSENSOR FABRICATION | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.doi | 10.1149/04514.0055ecst | en_US |
dc.identifier.journal | SENSORS, ACTUATORS, AND MICROSYSTEMS (GENERAL) - 221ST ECS MEETING | en_US |
dc.citation.volume | 45 | en_US |
dc.citation.spage | 55 | en_US |
dc.citation.epage | 66 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000325215100006 | en_US |
dc.citation.woscount | 0 | en_US |
顯示於類別: | 會議論文 |