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dc.contributor.authorHo, Chung-Hsiangen_US
dc.contributor.authorChou, Po-Chienen_US
dc.contributor.authorCheng, Stoneen_US
dc.date.accessioned2019-04-02T06:04:21Z-
dc.date.available2019-04-02T06:04:21Z-
dc.date.issued2013-01-01en_US
dc.identifier.issn1063-6854en_US
dc.identifier.urihttp://hdl.handle.net/11536/150627-
dc.description.abstractThis paper described the electronic performance of power module packaged high-power AlGaN/GaN high electron mobility transistors (HEMTs) on silicon substrate. Sixteen GaN chips are mounted on one AlN substrate. There are three AlN substrate in one module. Each device is wire-bonded in parallel connection to increase the power rating. Both DC and pulsed current-voltage (ID-VDS) characteristics are measured for different connection and sizes of devices, at various of power densities, pulse lengths, and duty factors. We found some conditions that makes the parallel connection difference down to zero. According that, The GaN has maxima drain current=5.98A(98.8%).en_US
dc.language.isoen_USen_US
dc.titleGaN HEMTs Power Module Package Design and Performance Evaluationen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2013 25TH INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES AND ICS (ISPSD)en_US
dc.citation.spage297en_US
dc.citation.epage299en_US
dc.contributor.department機械工程學系zh_TW
dc.contributor.departmentDepartment of Mechanical Engineeringen_US
dc.identifier.wosnumberWOS:000331229500069en_US
dc.citation.woscount0en_US
Appears in Collections:Conferences Paper