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dc.contributor.authorWang, Nanen_US
dc.contributor.authorHe, Jinpingen_US
dc.contributor.authorMiyazaki, Junen_US
dc.contributor.authorTsurui, Hiromichien_US
dc.contributor.authorKobayashi, Takayoshien_US
dc.date.accessioned2019-04-03T06:47:21Z-
dc.date.available2019-04-03T06:47:21Z-
dc.date.issued2015-01-01en_US
dc.identifier.isbn978-1-62841-846-0en_US
dc.identifier.issn0277-786Xen_US
dc.identifier.urihttp://dx.doi.org/10.1117/12.2186137en_US
dc.identifier.urihttp://hdl.handle.net/11536/150648-
dc.description.abstractSimultaneous two-color subtraction microscopy using mode multiplexing is realized experimentally. The samples are irradiated with single laser diode at wavelength of 445 nm. Then the beam split laser spots generate separate solid and donut spatial modes and are multiplexed with modulators for simultaneous excitation. The produced fluorescence signals are back collected and further divided into two color bands with dichroic mirrors. Then they are detected with two photomultipliers and demultiplexed in four lock-in amplifiers. Four fluorescence images are recorded in every scan and resolution enhanced images are obtained in two color channels after applying the subtraction strategy. With this method, imaging results of microspheres stained with organic dyes and mesenteric lymph nodes of a mouse labeled with quantum dots (Q525/650) are realized. Improvement of 20% similar to 30% in resolving power of the two color channels compared with confocal microscopy is achieved in with corresponding subtraction factor of about 0.3.en_US
dc.language.isoen_USen_US
dc.subjectsubtraction microscopyen_US
dc.subjectmulticolor imagingen_US
dc.subjectquantum doten_US
dc.subjectmode multiplexingen_US
dc.subjectfluorescence imagingen_US
dc.titleSub-diffraction-limit imaging using mode multiplexingen_US
dc.typeProceedings Paperen_US
dc.identifier.doi10.1117/12.2186137en_US
dc.identifier.journalSCANNING MICROSCOPIES 2015en_US
dc.citation.volume9636en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000367309200005en_US
dc.citation.woscount0en_US
Appears in Collections:Conferences Paper


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