Interface Discrete Trap Induced Variability for Negative Capacitance FinFETs

Full metadata record

DC Field	Value	Language
dc.contributor.author	Lee, Ho-Pei	en_US
dc.contributor.author	Tseng, Kuei-Yang	en_US
dc.contributor.author	Su, Pin	en_US
dc.date.accessioned	2019-04-02T06:04:21Z	-
dc.date.available	2019-04-02T06:04:21Z	-
dc.date.issued	2018-01-01	en_US
dc.identifier.issn	1930-8868	en_US
dc.identifier.uri	http://hdl.handle.net/11536/150744	-
dc.language.iso	en_US	en_US
dc.title	Interface Discrete Trap Induced Variability for Negative Capacitance FinFETs	en_US
dc.type	Proceedings Paper	en_US
dc.identifier.journal	2018 INTERNATIONAL SYMPOSIUM ON VLSI TECHNOLOGY, SYSTEMS AND APPLICATION (VLSI-TSA)	en_US
dc.contributor.department	電子工程學系及電子研究所	zh_TW
dc.contributor.department	Department of Electronics Engineering and Institute of Electronics	en_US
dc.identifier.wosnumber	WOS:000444900700025	en_US
dc.citation.woscount	0	en_US
Appears in Collections:	Conferences Paper