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dc.contributor.authorLee, Meng-Chuehen_US
dc.contributor.authorMa, Kenneth-Yeonkongen_US
dc.contributor.authorOuyang, Yen-Chiehen_US
dc.contributor.authorMang Ou-Yangen_US
dc.contributor.authorGuo, Horng-Yuhen_US
dc.contributor.authorLiu, Tsang-Senen_US
dc.contributor.authorChen, Hsian-Minen_US
dc.contributor.authorWu, Chao-Chengen_US
dc.contributor.authorChang, Chgein-Ien_US
dc.date.accessioned2019-04-02T06:04:24Z-
dc.date.available2019-04-02T06:04:24Z-
dc.date.issued2018-01-01en_US
dc.identifier.issn2153-6996en_US
dc.identifier.urihttp://hdl.handle.net/11536/150850-
dc.description.abstractPhalaenopsis is a significant agriculture product with high economic value in Taiwan. However, the fusarium wilt causes Phalaenopsis leaves turning yellow, thinning, water loss, and finally died. This paper presents an emerging method to detect fusarium wilt on Phalaenopsis stem base. In order to build the detection models, the hyperspectral databases are generated form two statues of Phalaenopsis samples, which are health and disease sample. We applied band selection (BS) processing base on band prioritization (BP) and band de-correlation (BD) to extract the significant bands and eliminate the redundant bands. Then, three algorithms were used, orthogonal subspace projection (OSP), constrain energy minimization (CEM), and support vector machine (SVM) to detect the fusarium wilt.en_US
dc.language.isoen_USen_US
dc.subjectHyperspectral imageen_US
dc.subjectPhalaenopsisen_US
dc.subjectfusarium wilten_US
dc.subjectBand selectionen_US
dc.subjectOSPen_US
dc.subjectCEMen_US
dc.subjectSVMen_US
dc.titleDETECTION OF FUSARIUM WILT ON PHALAENOPSIS STEM BASE REGION USING BAND SELECTION TECHNIQUESen_US
dc.typeProceedings Paperen_US
dc.identifier.journalIGARSS 2018 - 2018 IEEE INTERNATIONAL GEOSCIENCE AND REMOTE SENSING SYMPOSIUMen_US
dc.citation.spage2777en_US
dc.citation.epage2780en_US
dc.contributor.department電機工程學系zh_TW
dc.contributor.departmentDepartment of Electrical and Computer Engineeringen_US
dc.identifier.wosnumberWOS:000451039802215en_US
dc.citation.woscount0en_US
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