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dc.contributor.authorWu, Dai-Rongen_US
dc.contributor.authorTsai, Chia-Mingen_US
dc.contributor.authorLin, Sheng-Dien_US
dc.date.accessioned2019-04-02T06:04:46Z-
dc.date.available2019-04-02T06:04:46Z-
dc.date.issued2018-01-01en_US
dc.identifier.issn2160-5033en_US
dc.identifier.urihttp://hdl.handle.net/11536/150925-
dc.description.abstractWe investigate time-resolved crosstalk probability between single-photon avalanche diodes in CMOS technology. The time-correlated crosstalk measurements reveal an unusual double-peak feature. This behavior becomes more significant at higher excess bias voltages and shorter device-to-device distance and its physical reason will be discussed.en_US
dc.language.isoen_USen_US
dc.subjectSingle-photon avalanche diodesen_US
dc.subjectcrosstalken_US
dc.subjecttime correlationen_US
dc.subjectCMOS technologyen_US
dc.subjectbreakdown flashen_US
dc.titleTime-Correlated Crosstalk Measurements between CMOS Single-Photon Avalanche Diodesen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2018 INTERNATIONAL CONFERENCE ON OPTICAL MEMS AND NANOPHOTONICS (OMN)en_US
dc.citation.spage185en_US
dc.citation.epage186en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000454732000090en_US
dc.citation.woscount0en_US
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