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dc.contributor.authorAsha, K. A.en_US
dc.contributor.authorPatyal, Abhisheken_US
dc.contributor.authorChen, Hung-Mingen_US
dc.date.accessioned2019-04-02T06:04:23Z-
dc.date.available2019-04-02T06:04:23Z-
dc.date.issued2018-01-01en_US
dc.identifier.urihttp://hdl.handle.net/11536/151081-
dc.description.abstractPhysical Undonable functions (PUFs) generate secret keys that are unique and derived from the manufacturing process variations of the device. For high-security applications, generating the keys on the device is more secure than storing it on the device due to its resistance to attacks like tampering, probing and side-channel attacks. Also, the PUF-key generated should be very unique and reliable. In this paper, we are proposing a novel technique of generating a Ring Oscillator (RO) based PUF-keys on FPGAs by K-means clustering of RO frequencies. The placement of ROs on the FPGA fabric will have an impact on the variation of their oscillating frequencies. Based on the similarities in their frequency variations, the RO frequencies are grouped into k-clusters by K-means clustering and, the comparison of within-cluster RO frequencies will generate the PUF-keys. Our proposed method is evaluated on a large population of 193 Xilinx Spartan FPGAs. With the proposed method, the average inter die Ramming Weight of the PUF responses is 48.92% which is close to the ideal value of 50%, the average Ramming Weight of the n-bit PUF response is 49.90% and the average error rate due to changes in temperature and voltage is 3.43%.en_US
dc.language.isoen_USen_US
dc.subjectPUFen_US
dc.subjectRing Oscillator (RO)en_US
dc.subjectFPGAen_US
dc.subjectK-meansen_US
dc.subjectClusteringen_US
dc.titleGeneration of PUP-Keys on FPGAs by K-means Frequency Clusteringen_US
dc.typeProceedings Paperen_US
dc.identifier.journalPROCEEDINGS OF THE 2018 ASIAN HARDWARE ORIENTED SECURITY AND TRUST SYMPOSIUM (ASIANHOST)en_US
dc.citation.spage44en_US
dc.citation.epage49en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000458975500008en_US
dc.citation.woscount0en_US
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