| 標題: | Microcrystallinity of undoped amorphous silicon films and its effects on the transfer characteristics of thin film transistors |
| 作者: | Liang, CW Chiang, WC Feng, MS 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
| 公開日期: | 1-一月-1995 |
| URI: | http://hdl.handle.net/11536/151142 |
| 期刊: | PROCEEDINGS OF THE FOURTH INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED-CIRCUIT TECHNOLOGY |
| 顯示於類別： | 會議論文 |
- A novel thin-film transistor with vertical offset structure / Lin, CW;Chang, CY
- The effects of microcrystalline silicon film structure on low-high-low band-gap thin film transistor / Chang, CY;Lee, YS;Huang, TY;Shih, PS;Lin, CW
- Microcrystallinity of undoped amorphous silicon films and its effects on the transfer characteristics of thin-film transistors / Liang, CW;Chiang, WC;Feng, MS
- 低高低能隙結構之氫化微晶矽薄膜電晶體 / 李永祥;Yeong-Shyang Lee;張俊彥;Chun-Yen Chang
- A novel thin-film transistor with vertical offset structure / Lin, CW;Chang, CY
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