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dc.contributor.authorI-Chen LINen_US
dc.contributor.authorJun-Yang LINen_US
dc.contributor.authorMei-Fang SHEen_US
dc.contributor.authorWen-Hsiang TSAIen_US
dc.date.accessioned2019-04-11T05:42:44Z-
dc.date.available2019-04-11T05:42:44Z-
dc.date.issued2017-05-25en_US
dc.identifier.govdocG06F017/30en_US
dc.identifier.govdocG06K009/52en_US
dc.identifier.govdocG06K009/46en_US
dc.identifier.urihttp://hdl.handle.net/11536/151277-
dc.description.abstractA method for analyzing and searching 3D models includes steps of obtaining data global features and data local features of data images by globally analyzing and locally analyzing data images of 3D models respectively; obtaining searching global features and searching local features by globally analyzing and locally analyzing searching images respectively; obtaining corresponding data global features and corresponding data local features based on the search global features and the searching local feature; and obtaining corresponding data images based on the corresponding data global features and the corresponding data local features.en_US
dc.language.isoen_USen_US
dc.titleMETHOD FOR ANALYZING AND SEARCHING 3D MODELSen_US
dc.typePatentsen_US
dc.citation.patentcountryUSAen_US
dc.citation.patentnumber20170147609en_US
Appears in Collections:Patents


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