完整後設資料紀錄
DC 欄位語言
dc.contributor.authorChen, Tolyen_US
dc.date.accessioned2019-06-03T01:08:29Z-
dc.date.available2019-06-03T01:08:29Z-
dc.date.issued2019-08-01en_US
dc.identifier.issn0263-2241en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.measurement.2019.04.070en_US
dc.identifier.urihttp://hdl.handle.net/11536/151895-
dc.description.abstractForecasting the yield of each product is critical for a semiconductor manufacturer. To enhance the performance of forecasting the yield of a semiconductor product, a hybrid-aggregation and entropy-consensus fuzzy collaborative intelligence (FCI) approach is proposed in this study. The novelty of the proposed approach is in its use of a hybrid aggregation mechanism that first aggregates fuzzy yield forecasts by using a fuzzy weighted average (FWA) and then adjusts the FWA result by using fuzzy intersection (FL). In this way, both subjective and objective viewpoints are considered in forecasting the yield of a semiconductor product. In addition, the consensus among experts is measured with the entropy of the aggregation result. After consensus is reached, the aggregation result is defuzzified using a back propagation network (BPN). The effectiveness of the proposed methodology is validated by analyzing a real case. According to the analysis results, the forecasting accuracy, measured in terms of mean absolute error (MAE) or mean absolute percentage error (MAPE), improved considerably when using the proposed methodology. (C) 2019 Elsevier Ltd. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectFuzzy collaborative intelligenceen_US
dc.subjectYielden_US
dc.subjectSemiconductoren_US
dc.subjectFuzzy weighted averageen_US
dc.subjectEntropyen_US
dc.titleForecasting the yield of a semiconductor product using a hybrid-aggregation and entropy-consensus fuzzy collaborative intelligence approachen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.measurement.2019.04.070en_US
dc.identifier.journalMEASUREMENTen_US
dc.citation.volume142en_US
dc.citation.spage60en_US
dc.citation.epage67en_US
dc.contributor.department工業工程與管理學系zh_TW
dc.contributor.departmentDepartment of Industrial Engineering and Managementen_US
dc.identifier.wosnumberWOS:000468142300007en_US
dc.citation.woscount0en_US
顯示於類別:期刊論文