完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Martin, Sebastien | en_US |
dc.contributor.author | Choi, Charles T. M. | en_US |
dc.date.accessioned | 2019-06-03T01:08:30Z | - |
dc.date.available | 2019-06-03T01:08:30Z | - |
dc.date.issued | 2019-06-01 | en_US |
dc.identifier.issn | 0018-9464 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1109/TMAG.2019.2900349 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/151901 | - |
dc.description.abstract | The goal in electrical impedance tomography is to obtain the electrical properties of different materials by applying an electrical current and measuring the resulting potential difference at the boundaries of the domain. While the numerical accuracy is technically limited by the size of the elements within the finite-element (FE) mesh, using a fine mesh will result in a computationally demanding reconstruction, especially when the region of interest (ROI) is not known. However, this situation is different when the location is known, when one can easily refine the FE model around the target, aiming for greater accuracy around the ROI. In this paper, an innovative approach estimates the location of the target object before solving the inverse problem, so that it becomes possible to refine only a specific area of the FE model. A powerful artificial intelligence method is used to obtain this region. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | Electrical impedance tomography (EIT) | en_US |
dc.subject | finite element (FE) | en_US |
dc.subject | inverse problem | en_US |
dc.subject | machine learning | en_US |
dc.title | Fast and Accurate Solution of the Inverse Problem for Image Reconstruction Using Electrical Impedance Tomography | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1109/TMAG.2019.2900349 | en_US |
dc.identifier.journal | IEEE TRANSACTIONS ON MAGNETICS | en_US |
dc.citation.volume | 55 | en_US |
dc.citation.issue | 6 | en_US |
dc.citation.spage | 0 | en_US |
dc.citation.epage | 0 | en_US |
dc.contributor.department | 分子醫學與生物工程研究所 | zh_TW |
dc.contributor.department | 電機工程學系 | zh_TW |
dc.contributor.department | 電控工程研究所 | zh_TW |
dc.contributor.department | Institute of Molecular Medicine and Bioengineering | en_US |
dc.contributor.department | Department of Electrical and Computer Engineering | en_US |
dc.contributor.department | Institute of Electrical and Control Engineering | en_US |
dc.identifier.wosnumber | WOS:000468270500001 | en_US |
dc.citation.woscount | 0 | en_US |
顯示於類別: | 期刊論文 |